Failure of The Incoherent Imaging Approximation in “Sub-Angstrom” STEM Images: A Real-Space Consequence of Electron Channeling

Failure of The Incoherent Imaging Approximation in “Sub-Angstrom” STEM Images: A Real-Space Consequence of Electron Channeling

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.714-715
Hauptverfasser: Hovden, R., Xin, H.L., Muller, D.A.
Format: Artikel
Sprache:eng
Schlagworte:
Approximation
Channeling Effects in Microscopy and Microanalysis-04
Electrons
Instrumentation Symposium
Microscopy
Physics
Semiconductor research
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612005429