Surface Preparation for Characterizing Microstructure on Transuranic Oxides by Electron Backscatter Spectroscopy and Ion Beam Imaging

Surface Preparation for Characterizing Microstructure on Transuranic Oxides by Electron Backscatter Spectroscopy and Ion Beam Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.708-709
Hauptverfasser: Papin, P.A., Chris, C., Forsyth, R.T., Luther, E.P., Necker, C.T.
Format: Artikel
Sprache:eng
Schlagworte:
Channeling Effects in Microscopy and Microanalysis-04
Instrumentation Symposium
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612005399