STEM Characterization of Defects Generated During the Stress-Induced Martensitic Transformation in NiTi Microcrystals

STEM Characterization of Defects Generated During the Stress-Induced Martensitic Transformation in NiTi Microcrystals

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.754-755
Hauptverfasser: Bowers, M.L., Manchiraju, S., Anderson, P.M., Mills, M.J.
Format: Artikel
Sprache:eng
Schlagworte:
Engineering
Heat treating
Instrumentation Symposium
Measurement and Visualization of Mechanical Behavior at Micro and Nano-scales-05
Microscopy
Single crystals
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612005624