Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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| Veröffentlicht in: | Microscopy and microanalysis 2012-07, Vol.18 (S2), p.412-413 |
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| container_end_page | 413 |
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| container_issue | S2 |
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| container_title | Microscopy and microanalysis |
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| creator | Kim, Y. Kumar, A. Ivanov, I. Tselev, A. Biegalski, M.D. Pennycook, S.J. Kalinin, S.V. Borisevich, A.Y. Hatt, A. Morozovska, A. Eliseev, E. Chu, Y. Yu, P. Ramesh, R. Rondinelli, J. |
| description | Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. |
| doi_str_mv | 10.1017/S1431927612003911 |
| format | Article |
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| source | Cambridge University Press Journals Complete |
| subjects | Applications of Aberration-Corrected STEM and SEM-09 Electrons Information storage Instrumentation Symposium Interfaces Microscopy Thin films |
| title | Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect |
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