Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.412-413
Hauptverfasser: Kim, Y., Kumar, A., Ivanov, I., Tselev, A., Biegalski, M.D., Pennycook, S.J., Kalinin, S.V., Borisevich, A.Y., Hatt, A., Morozovska, A., Eliseev, E., Chu, Y., Yu, P., Ramesh, R., Rondinelli, J.
Format: Artikel
Sprache:eng
Schlagworte:
Applications of Aberration-Corrected STEM and SEM-09
Electrons
Information storage
Instrumentation Symposium
Interfaces
Microscopy
Thin films
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612003911