Corrugation-Induced SiO Planar Long-Period Gratings for Photonic Applications
A long-period grating based on silica planar lightwave circuit technology is reported. The grating structure has been realized by forming a periodic corrugation on the lower waveguide cladding layer. This structure offers a permanent refractive index modulation, resulting in a grating that is highly...
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| Veröffentlicht in: | IEEE photonics technology letters 2010-07, Vol.22 (13), p.951-953 |
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| creator | Jia Jiang Callender, Claire L Ledderhof, Christopher J |
| description | A long-period grating based on silica planar lightwave circuit technology is reported. The grating structure has been realized by forming a periodic corrugation on the lower waveguide cladding layer. This structure offers a permanent refractive index modulation, resulting in a grating that is highly stable to environmental variation. A strong rejection band is observed at a specified resonance wavelength. Device sensitivity to external refractive index change of up to 2.9 × 10 -6 /pm can be achieved without any surface modification. Thermal characterization has demonstrated a temperature dependence of only 24.5 pm/°C . |
| doi_str_mv | 10.1109/LPT.2010.2048019 |
| format | Article |
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The grating structure has been realized by forming a periodic corrugation on the lower waveguide cladding layer. This structure offers a permanent refractive index modulation, resulting in a grating that is highly stable to environmental variation. A strong rejection band is observed at a specified resonance wavelength. Device sensitivity to external refractive index change of up to 2.9 × 10 -6 /pm can be achieved without any surface modification. Thermal characterization has demonstrated a temperature dependence of only 24.5 pm/°C .</description><identifier>ISSN: 1041-1135</identifier><identifier>EISSN: 1941-0174</identifier><identifier>DOI: 10.1109/LPT.2010.2048019</identifier><identifier>CODEN: IPTLEL</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Erbium-doped fiber amplifier ; Gratings ; Long-period grating (LPG) ; Optical planar waveguides ; Optical waveguides ; Periodic structures ; Planar waveguides ; Refractive index ; Resonance ; resonant wavelength ; silica ; Silicon compounds ; waveguide ; Waveguide transitions</subject><ispartof>IEEE photonics technology letters, 2010-07, Vol.22 (13), p.951-953</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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The grating structure has been realized by forming a periodic corrugation on the lower waveguide cladding layer. This structure offers a permanent refractive index modulation, resulting in a grating that is highly stable to environmental variation. A strong rejection band is observed at a specified resonance wavelength. Device sensitivity to external refractive index change of up to 2.9 × 10 -6 /pm can be achieved without any surface modification. Thermal characterization has demonstrated a temperature dependence of only 24.5 pm/°C .</description><subject>Erbium-doped fiber amplifier</subject><subject>Gratings</subject><subject>Long-period grating (LPG)</subject><subject>Optical planar waveguides</subject><subject>Optical waveguides</subject><subject>Periodic structures</subject><subject>Planar waveguides</subject><subject>Refractive index</subject><subject>Resonance</subject><subject>resonant wavelength</subject><subject>silica</subject><subject>Silicon compounds</subject><subject>waveguide</subject><subject>Waveguide transitions</subject><issn>1041-1135</issn><issn>1941-0174</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM9LwzAUx4MoOKd3wUvBc-d7Tdo0xzF0DiorOM8lSdPZMZOarAf_ezM3vLwf8Pl-3-NLyD3CDBHEU1VvZhnELQNWAooLMkHBMAXk7DLOEGdEml-TmxB2AMhyyibkbeG8H7fy0Dubrmw7atMm7_06qffSSp9Uzm7T2vjetcnSR8xuQ9I5n9Sf7uBsr5P5MOx7_WcQbslVJ_fB3J37lHy8PG8Wr2m1Xq4W8yrVSAueaqGE5kBNkYFuC0HbXMsSc825UPF3g1KJDkulFVesFC1kSqKSGRYilo5OyePJd_DuezTh0Ozc6G082SCUWOQ5Ch4pOFHauxC86ZrB91_S_0SoOYbWxNCaY2jNObQoeThJemPMP54zxjnP6C9_UWeG</recordid><startdate>20100701</startdate><enddate>20100701</enddate><creator>Jia Jiang</creator><creator>Callender, Claire L</creator><creator>Ledderhof, Christopher J</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20100701</creationdate><title>Corrugation-Induced SiO Planar Long-Period Gratings for Photonic Applications</title><author>Jia Jiang ; Callender, Claire L ; Ledderhof, Christopher J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1367-c9b9c703e620cd693d5ca815c779b019e1ab9f18bcb7b489d02ba1ba2169a21f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Erbium-doped fiber amplifier</topic><topic>Gratings</topic><topic>Long-period grating (LPG)</topic><topic>Optical planar waveguides</topic><topic>Optical waveguides</topic><topic>Periodic structures</topic><topic>Planar waveguides</topic><topic>Refractive index</topic><topic>Resonance</topic><topic>resonant wavelength</topic><topic>silica</topic><topic>Silicon compounds</topic><topic>waveguide</topic><topic>Waveguide transitions</topic><toplevel>online_resources</toplevel><creatorcontrib>Jia Jiang</creatorcontrib><creatorcontrib>Callender, Claire L</creatorcontrib><creatorcontrib>Ledderhof, Christopher J</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE photonics technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jia Jiang</au><au>Callender, Claire L</au><au>Ledderhof, Christopher J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Corrugation-Induced SiO Planar Long-Period Gratings for Photonic Applications</atitle><jtitle>IEEE photonics technology letters</jtitle><stitle>LPT</stitle><date>2010-07-01</date><risdate>2010</risdate><volume>22</volume><issue>13</issue><spage>951</spage><epage>953</epage><pages>951-953</pages><issn>1041-1135</issn><eissn>1941-0174</eissn><coden>IPTLEL</coden><abstract>A long-period grating based on silica planar lightwave circuit technology is reported. The grating structure has been realized by forming a periodic corrugation on the lower waveguide cladding layer. This structure offers a permanent refractive index modulation, resulting in a grating that is highly stable to environmental variation. A strong rejection band is observed at a specified resonance wavelength. Device sensitivity to external refractive index change of up to 2.9 × 10 -6 /pm can be achieved without any surface modification. Thermal characterization has demonstrated a temperature dependence of only 24.5 pm/°C .</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/LPT.2010.2048019</doi><tpages>3</tpages></addata></record> |
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| ispartof | IEEE photonics technology letters, 2010-07, Vol.22 (13), p.951-953 |
| issn | 1041-1135 1941-0174 |
| language | eng |
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| subjects | Erbium-doped fiber amplifier Gratings Long-period grating (LPG) Optical planar waveguides Optical waveguides Periodic structures Planar waveguides Refractive index Resonance resonant wavelength silica Silicon compounds waveguide Waveguide transitions |
| title | Corrugation-Induced SiO Planar Long-Period Gratings for Photonic Applications |
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