Corrugation-Induced SiO Planar Long-Period Gratings for Photonic Applications

Corrugation-Induced SiO Planar Long-Period Gratings for Photonic Applications

A long-period grating based on silica planar lightwave circuit technology is reported. The grating structure has been realized by forming a periodic corrugation on the lower waveguide cladding layer. This structure offers a permanent refractive index modulation, resulting in a grating that is highly...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE photonics technology letters 2010-07, Vol.22 (13), p.951-953
Hauptverfasser: Jia Jiang, Callender, Claire L, Ledderhof, Christopher J
Format: Artikel
Sprache:eng
Schlagworte:
Erbium-doped fiber amplifier
Gratings
Long-period grating (LPG)
Optical planar waveguides
Optical waveguides
Periodic structures
Planar waveguides
Refractive index
Resonance
resonant wavelength
silica
Silicon compounds
waveguide
Waveguide transitions
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A long-period grating based on silica planar lightwave circuit technology is reported. The grating structure has been realized by forming a periodic corrugation on the lower waveguide cladding layer. This structure offers a permanent refractive index modulation, resulting in a grating that is highly stable to environmental variation. A strong rejection band is observed at a specified resonance wavelength. Device sensitivity to external refractive index change of up to 2.9 × 10 -6 /pm can be achieved without any surface modification. Thermal characterization has demonstrated a temperature dependence of only 24.5 pm/°C .
ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2010.2048019