Design for Test and Testability

This chapter defines the engineering role of designing for maintainability concurrent with Design for Test (DfT) and Design for Testability. It discusses DfT techniques for three distinct categories of hardware levels: DfT at system or product level, DfT at electronic circuit board level, and DfT at electronic device or component level DFT techniques used for development and manufacturing test activities at these three hardware levels turn out to be very handy for maintainability activities. The chapter provides some key definitions of test and design for test methods for electronic circuit boards and devices. Engineers use DfT techniques for development and manufacturing tests at all hardware levels of a system. The chapter describes the electronic circuit board assembly level of testability. It also discusses in more depth the test coverage of the three electronic device types: logic, memory, and analog/mixed‐signal.