On the theory of X-ray diffraction in a perfect crystal with distorted surface layer

X‐ray diffraction in a perfect crystal with distorted surface layer is considered on the basis of the recurrence relations for amplitude reflection and transmission coefficients of X‐rays in a multilayer crystal. It is shown that such parameters of a distorted layer as its thickness and change in the interplanar spacing can be determined directly from diffraction curves of different orders. [Russian Text Ignored]