Tools and techniques for VLSI quality

Tools and techniques for VLSI quality

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Veröffentlicht in:AT&T technical journal 1986-03, Vol.65 (2), p.77-84
Hauptverfasser: GOKSEL, A. K, SEKINO, W. T, TROUTMAN, W. W
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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container_end_page 84
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container_title AT&T technical journal
container_volume 65
creator GOKSEL, A. K
SEKINO, W. T
TROUTMAN, W. W
description
doi_str_mv 10.1002/j.1538-7305.1986.tb00295.x
format Article
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identifier ISSN: 8756-2324
ispartof AT&T technical journal, 1986-03, Vol.65 (2), p.77-84
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2376-676X
language eng
recordid cdi_pascalfrancis_primary_8786612
source IEEE Electronic Library (IEL)
subjects Applied sciences
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title Tools and techniques for VLSI quality
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