A Josephson array voltage standard at 10 V
The technology of Josephson voltage standards has been extended to an array of 14 184 junctions which is capable of generating over 150 000 quantized voltage levels spanning the range from -12 to +12 V. This makes possible the direct calibration of 10-V Zener reference standards without the use of a...
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Veröffentlicht in: | IEEE Electron Device Lett.; (United States) 1987-10, Vol.8 (10), p.449-450 |
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container_title | IEEE Electron Device Lett.; (United States) |
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creator | Lloyd, F.L. Hamilton, C.A. Beall, J.A. Diane Go Ono, R.H. Harris, R.E. |
description | The technology of Josephson voltage standards has been extended to an array of 14 184 junctions which is capable of generating over 150 000 quantized voltage levels spanning the range from -12 to +12 V. This makes possible the direct calibration of 10-V Zener reference standards without the use of a voltage divider. |
doi_str_mv | 10.1109/EDL.1987.26690 |
format | Article |
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This makes possible the direct calibration of 10-V Zener reference standards without the use of a voltage divider.</description><identifier>ISSN: 0741-3106</identifier><identifier>EISSN: 1558-0563</identifier><identifier>DOI: 10.1109/EDL.1987.26690</identifier><identifier>CODEN: EDLEDZ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>420201 - Engineering- Cryogenic Equipment & Devices ; Applied sciences ; CALIBRATION ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; Critical current ; ELECTRIC POTENTIAL ; Electrodes ; Electronics ; Exact sciences and technology ; Fabrication ; JOSEPHSON JUNCTIONS ; JUNCTION DIODES ; JUNCTIONS ; Plasma applications ; Plasma density ; Radio frequency ; Reflection ; SEMICONDUCTOR DEVICES ; SEMICONDUCTOR DIODES ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Stripline ; Superconducting devices ; SUPERCONDUCTING JUNCTIONS ; Voltage ; VOLTAGE REGULATORS</subject><ispartof>IEEE Electron Device Lett.; (United States), 1987-10, Vol.8 (10), p.449-450</ispartof><rights>1988 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c375t-ad1f7f4a84adb16e30f7167214ea961f603a8e492991f27bf941beb989b8f8d13</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1487240$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,881,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1487240$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=7577221$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/7246342$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Lloyd, F.L.</creatorcontrib><creatorcontrib>Hamilton, C.A.</creatorcontrib><creatorcontrib>Beall, J.A.</creatorcontrib><creatorcontrib>Diane Go</creatorcontrib><creatorcontrib>Ono, R.H.</creatorcontrib><creatorcontrib>Harris, R.E.</creatorcontrib><creatorcontrib>Electromagnetic Technology Div., National Bureau of Standards, Boulder, CO (US)</creatorcontrib><title>A Josephson array voltage standard at 10 V</title><title>IEEE Electron Device Lett.; (United States)</title><addtitle>LED</addtitle><description>The technology of Josephson voltage standards has been extended to an array of 14 184 junctions which is capable of generating over 150 000 quantized voltage levels spanning the range from -12 to +12 V. This makes possible the direct calibration of 10-V Zener reference standards without the use of a voltage divider.</description><subject>420201 - Engineering- Cryogenic Equipment & Devices</subject><subject>Applied sciences</subject><subject>CALIBRATION</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>Critical current</subject><subject>ELECTRIC POTENTIAL</subject><subject>Electrodes</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fabrication</subject><subject>JOSEPHSON JUNCTIONS</subject><subject>JUNCTION DIODES</subject><subject>JUNCTIONS</subject><subject>Plasma applications</subject><subject>Plasma density</subject><subject>Radio frequency</subject><subject>Reflection</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SEMICONDUCTOR DIODES</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Stripline</subject><subject>Superconducting devices</subject><subject>SUPERCONDUCTING JUNCTIONS</subject><subject>Voltage</subject><subject>VOLTAGE REGULATORS</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1987</creationdate><recordtype>article</recordtype><recordid>eNqFkDtPwzAUhS0EEqWwsrBECDEgpfjajh8jgvJSJRZgtW4cmwalSbEDUv89Ka1gZDrLd450PkKOgU4AqLmc3swmYLSaMCkN3SEjKAqd00LyXTKiSkDOgcp9cpDSO6UghBIjcnGVPXbJL-epazOMEVfZV9f0-Oaz1GNbYawy7DOg2esh2QvYJH-0zTF5uZ0-X9_ns6e7h-urWe64KvocKwgqCNQCqxKk5zQokIqB8GgkBEk5ai8MMwYCU2UwAkpfGm1KHXQFfExON7td6mubXN17N3dd23rXW8WE5IIN0PkGWsbu49On3i7q5HzTYOu7z2SZ5owpoP-DQhjQIAdwsgFd7FKKPthlrBcYVxaoXQu2g2C7Fmx_BA-Fs-0yJodNiNi6Ov22VKEUY-s7Jxus9t7_bQo9XKH8G5Zqf-8</recordid><startdate>19871001</startdate><enddate>19871001</enddate><creator>Lloyd, F.L.</creator><creator>Hamilton, C.A.</creator><creator>Beall, J.A.</creator><creator>Diane Go</creator><creator>Ono, R.H.</creator><creator>Harris, R.E.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>19871001</creationdate><title>A Josephson array voltage standard at 10 V</title><author>Lloyd, F.L. ; Hamilton, C.A. ; Beall, J.A. ; Diane Go ; Ono, R.H. ; Harris, R.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c375t-ad1f7f4a84adb16e30f7167214ea961f603a8e492991f27bf941beb989b8f8d13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1987</creationdate><topic>420201 - Engineering- Cryogenic Equipment & Devices</topic><topic>Applied sciences</topic><topic>CALIBRATION</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>Critical current</topic><topic>ELECTRIC POTENTIAL</topic><topic>Electrodes</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fabrication</topic><topic>JOSEPHSON JUNCTIONS</topic><topic>JUNCTION DIODES</topic><topic>JUNCTIONS</topic><topic>Plasma applications</topic><topic>Plasma density</topic><topic>Radio frequency</topic><topic>Reflection</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SEMICONDUCTOR DIODES</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Stripline</topic><topic>Superconducting devices</topic><topic>SUPERCONDUCTING JUNCTIONS</topic><topic>Voltage</topic><topic>VOLTAGE REGULATORS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lloyd, F.L.</creatorcontrib><creatorcontrib>Hamilton, C.A.</creatorcontrib><creatorcontrib>Beall, J.A.</creatorcontrib><creatorcontrib>Diane Go</creatorcontrib><creatorcontrib>Ono, R.H.</creatorcontrib><creatorcontrib>Harris, R.E.</creatorcontrib><creatorcontrib>Electromagnetic Technology Div., National Bureau of Standards, Boulder, CO (US)</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection><jtitle>IEEE Electron Device Lett.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lloyd, F.L.</au><au>Hamilton, C.A.</au><au>Beall, J.A.</au><au>Diane Go</au><au>Ono, R.H.</au><au>Harris, R.E.</au><aucorp>Electromagnetic Technology Div., National Bureau of Standards, Boulder, CO (US)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Josephson array voltage standard at 10 V</atitle><jtitle>IEEE Electron Device Lett.; (United States)</jtitle><stitle>LED</stitle><date>1987-10-01</date><risdate>1987</risdate><volume>8</volume><issue>10</issue><spage>449</spage><epage>450</epage><pages>449-450</pages><issn>0741-3106</issn><eissn>1558-0563</eissn><coden>EDLEDZ</coden><abstract>The technology of Josephson voltage standards has been extended to an array of 14 184 junctions which is capable of generating over 150 000 quantized voltage levels spanning the range from -12 to +12 V. This makes possible the direct calibration of 10-V Zener reference standards without the use of a voltage divider.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/EDL.1987.26690</doi><tpages>2</tpages></addata></record> |
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subjects | 420201 - Engineering- Cryogenic Equipment & Devices Applied sciences CALIBRATION CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS Critical current ELECTRIC POTENTIAL Electrodes Electronics Exact sciences and technology Fabrication JOSEPHSON JUNCTIONS JUNCTION DIODES JUNCTIONS Plasma applications Plasma density Radio frequency Reflection SEMICONDUCTOR DEVICES SEMICONDUCTOR DIODES Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Stripline Superconducting devices SUPERCONDUCTING JUNCTIONS Voltage VOLTAGE REGULATORS |
title | A Josephson array voltage standard at 10 V |
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