A Josephson array voltage standard at 10 V

The technology of Josephson voltage standards has been extended to an array of 14 184 junctions which is capable of generating over 150 000 quantized voltage levels spanning the range from -12 to +12 V. This makes possible the direct calibration of 10-V Zener reference standards without the use of a...

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Veröffentlicht in:IEEE Electron Device Lett.; (United States) 1987-10, Vol.8 (10), p.449-450
Hauptverfasser: Lloyd, F.L., Hamilton, C.A., Beall, J.A., Diane Go, Ono, R.H., Harris, R.E.
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container_end_page 450
container_issue 10
container_start_page 449
container_title IEEE Electron Device Lett.; (United States)
container_volume 8
creator Lloyd, F.L.
Hamilton, C.A.
Beall, J.A.
Diane Go
Ono, R.H.
Harris, R.E.
description The technology of Josephson voltage standards has been extended to an array of 14 184 junctions which is capable of generating over 150 000 quantized voltage levels spanning the range from -12 to +12 V. This makes possible the direct calibration of 10-V Zener reference standards without the use of a voltage divider.
doi_str_mv 10.1109/EDL.1987.26690
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_pascalfrancis_primary_7577221</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1487240</ieee_id><sourcerecordid>24491816</sourcerecordid><originalsourceid>FETCH-LOGICAL-c375t-ad1f7f4a84adb16e30f7167214ea961f603a8e492991f27bf941beb989b8f8d13</originalsourceid><addsrcrecordid>eNqFkDtPwzAUhS0EEqWwsrBECDEgpfjajh8jgvJSJRZgtW4cmwalSbEDUv89Ka1gZDrLd450PkKOgU4AqLmc3swmYLSaMCkN3SEjKAqd00LyXTKiSkDOgcp9cpDSO6UghBIjcnGVPXbJL-epazOMEVfZV9f0-Oaz1GNbYawy7DOg2esh2QvYJH-0zTF5uZ0-X9_ns6e7h-urWe64KvocKwgqCNQCqxKk5zQokIqB8GgkBEk5ai8MMwYCU2UwAkpfGm1KHXQFfExON7td6mubXN17N3dd23rXW8WE5IIN0PkGWsbu49On3i7q5HzTYOu7z2SZ5owpoP-DQhjQIAdwsgFd7FKKPthlrBcYVxaoXQu2g2C7Fmx_BA-Fs-0yJodNiNi6Ov22VKEUY-s7Jxus9t7_bQo9XKH8G5Zqf-8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24491816</pqid></control><display><type>article</type><title>A Josephson array voltage standard at 10 V</title><source>IEEE Electronic Library (IEL)</source><creator>Lloyd, F.L. ; Hamilton, C.A. ; Beall, J.A. ; Diane Go ; Ono, R.H. ; Harris, R.E.</creator><creatorcontrib>Lloyd, F.L. ; Hamilton, C.A. ; Beall, J.A. ; Diane Go ; Ono, R.H. ; Harris, R.E. ; Electromagnetic Technology Div., National Bureau of Standards, Boulder, CO (US)</creatorcontrib><description>The technology of Josephson voltage standards has been extended to an array of 14 184 junctions which is capable of generating over 150 000 quantized voltage levels spanning the range from -12 to +12 V. This makes possible the direct calibration of 10-V Zener reference standards without the use of a voltage divider.</description><identifier>ISSN: 0741-3106</identifier><identifier>EISSN: 1558-0563</identifier><identifier>DOI: 10.1109/EDL.1987.26690</identifier><identifier>CODEN: EDLEDZ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>420201 - Engineering- Cryogenic Equipment &amp; Devices ; Applied sciences ; CALIBRATION ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; Critical current ; ELECTRIC POTENTIAL ; Electrodes ; Electronics ; Exact sciences and technology ; Fabrication ; JOSEPHSON JUNCTIONS ; JUNCTION DIODES ; JUNCTIONS ; Plasma applications ; Plasma density ; Radio frequency ; Reflection ; SEMICONDUCTOR DEVICES ; SEMICONDUCTOR DIODES ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Stripline ; Superconducting devices ; SUPERCONDUCTING JUNCTIONS ; Voltage ; VOLTAGE REGULATORS</subject><ispartof>IEEE Electron Device Lett.; (United States), 1987-10, Vol.8 (10), p.449-450</ispartof><rights>1988 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c375t-ad1f7f4a84adb16e30f7167214ea961f603a8e492991f27bf941beb989b8f8d13</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1487240$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,881,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1487240$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=7577221$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/7246342$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Lloyd, F.L.</creatorcontrib><creatorcontrib>Hamilton, C.A.</creatorcontrib><creatorcontrib>Beall, J.A.</creatorcontrib><creatorcontrib>Diane Go</creatorcontrib><creatorcontrib>Ono, R.H.</creatorcontrib><creatorcontrib>Harris, R.E.</creatorcontrib><creatorcontrib>Electromagnetic Technology Div., National Bureau of Standards, Boulder, CO (US)</creatorcontrib><title>A Josephson array voltage standard at 10 V</title><title>IEEE Electron Device Lett.; (United States)</title><addtitle>LED</addtitle><description>The technology of Josephson voltage standards has been extended to an array of 14 184 junctions which is capable of generating over 150 000 quantized voltage levels spanning the range from -12 to +12 V. This makes possible the direct calibration of 10-V Zener reference standards without the use of a voltage divider.</description><subject>420201 - Engineering- Cryogenic Equipment &amp; Devices</subject><subject>Applied sciences</subject><subject>CALIBRATION</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>Critical current</subject><subject>ELECTRIC POTENTIAL</subject><subject>Electrodes</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fabrication</subject><subject>JOSEPHSON JUNCTIONS</subject><subject>JUNCTION DIODES</subject><subject>JUNCTIONS</subject><subject>Plasma applications</subject><subject>Plasma density</subject><subject>Radio frequency</subject><subject>Reflection</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SEMICONDUCTOR DIODES</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Stripline</subject><subject>Superconducting devices</subject><subject>SUPERCONDUCTING JUNCTIONS</subject><subject>Voltage</subject><subject>VOLTAGE REGULATORS</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1987</creationdate><recordtype>article</recordtype><recordid>eNqFkDtPwzAUhS0EEqWwsrBECDEgpfjajh8jgvJSJRZgtW4cmwalSbEDUv89Ka1gZDrLd450PkKOgU4AqLmc3swmYLSaMCkN3SEjKAqd00LyXTKiSkDOgcp9cpDSO6UghBIjcnGVPXbJL-epazOMEVfZV9f0-Oaz1GNbYawy7DOg2esh2QvYJH-0zTF5uZ0-X9_ns6e7h-urWe64KvocKwgqCNQCqxKk5zQokIqB8GgkBEk5ai8MMwYCU2UwAkpfGm1KHXQFfExON7td6mubXN17N3dd23rXW8WE5IIN0PkGWsbu49On3i7q5HzTYOu7z2SZ5owpoP-DQhjQIAdwsgFd7FKKPthlrBcYVxaoXQu2g2C7Fmx_BA-Fs-0yJodNiNi6Ov22VKEUY-s7Jxus9t7_bQo9XKH8G5Zqf-8</recordid><startdate>19871001</startdate><enddate>19871001</enddate><creator>Lloyd, F.L.</creator><creator>Hamilton, C.A.</creator><creator>Beall, J.A.</creator><creator>Diane Go</creator><creator>Ono, R.H.</creator><creator>Harris, R.E.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>19871001</creationdate><title>A Josephson array voltage standard at 10 V</title><author>Lloyd, F.L. ; Hamilton, C.A. ; Beall, J.A. ; Diane Go ; Ono, R.H. ; Harris, R.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c375t-ad1f7f4a84adb16e30f7167214ea961f603a8e492991f27bf941beb989b8f8d13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1987</creationdate><topic>420201 - Engineering- Cryogenic Equipment &amp; Devices</topic><topic>Applied sciences</topic><topic>CALIBRATION</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>Critical current</topic><topic>ELECTRIC POTENTIAL</topic><topic>Electrodes</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fabrication</topic><topic>JOSEPHSON JUNCTIONS</topic><topic>JUNCTION DIODES</topic><topic>JUNCTIONS</topic><topic>Plasma applications</topic><topic>Plasma density</topic><topic>Radio frequency</topic><topic>Reflection</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SEMICONDUCTOR DIODES</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Stripline</topic><topic>Superconducting devices</topic><topic>SUPERCONDUCTING JUNCTIONS</topic><topic>Voltage</topic><topic>VOLTAGE REGULATORS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lloyd, F.L.</creatorcontrib><creatorcontrib>Hamilton, C.A.</creatorcontrib><creatorcontrib>Beall, J.A.</creatorcontrib><creatorcontrib>Diane Go</creatorcontrib><creatorcontrib>Ono, R.H.</creatorcontrib><creatorcontrib>Harris, R.E.</creatorcontrib><creatorcontrib>Electromagnetic Technology Div., National Bureau of Standards, Boulder, CO (US)</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection><jtitle>IEEE Electron Device Lett.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lloyd, F.L.</au><au>Hamilton, C.A.</au><au>Beall, J.A.</au><au>Diane Go</au><au>Ono, R.H.</au><au>Harris, R.E.</au><aucorp>Electromagnetic Technology Div., National Bureau of Standards, Boulder, CO (US)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Josephson array voltage standard at 10 V</atitle><jtitle>IEEE Electron Device Lett.; (United States)</jtitle><stitle>LED</stitle><date>1987-10-01</date><risdate>1987</risdate><volume>8</volume><issue>10</issue><spage>449</spage><epage>450</epage><pages>449-450</pages><issn>0741-3106</issn><eissn>1558-0563</eissn><coden>EDLEDZ</coden><abstract>The technology of Josephson voltage standards has been extended to an array of 14 184 junctions which is capable of generating over 150 000 quantized voltage levels spanning the range from -12 to +12 V. This makes possible the direct calibration of 10-V Zener reference standards without the use of a voltage divider.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/EDL.1987.26690</doi><tpages>2</tpages></addata></record>
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identifier ISSN: 0741-3106
ispartof IEEE Electron Device Lett.; (United States), 1987-10, Vol.8 (10), p.449-450
issn 0741-3106
1558-0563
language eng
recordid cdi_pascalfrancis_primary_7577221
source IEEE Electronic Library (IEL)
subjects 420201 - Engineering- Cryogenic Equipment & Devices
Applied sciences
CALIBRATION
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Critical current
ELECTRIC POTENTIAL
Electrodes
Electronics
Exact sciences and technology
Fabrication
JOSEPHSON JUNCTIONS
JUNCTION DIODES
JUNCTIONS
Plasma applications
Plasma density
Radio frequency
Reflection
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Stripline
Superconducting devices
SUPERCONDUCTING JUNCTIONS
Voltage
VOLTAGE REGULATORS
title A Josephson array voltage standard at 10 V
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-19T09%3A15%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Josephson%20array%20voltage%20standard%20at%2010%20V&rft.jtitle=IEEE%20Electron%20Device%20Lett.;%20(United%20States)&rft.au=Lloyd,%20F.L.&rft.aucorp=Electromagnetic%20Technology%20Div.,%20National%20Bureau%20of%20Standards,%20Boulder,%20CO%20(US)&rft.date=1987-10-01&rft.volume=8&rft.issue=10&rft.spage=449&rft.epage=450&rft.pages=449-450&rft.issn=0741-3106&rft.eissn=1558-0563&rft.coden=EDLEDZ&rft_id=info:doi/10.1109/EDL.1987.26690&rft_dat=%3Cproquest_RIE%3E24491816%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=24491816&rft_id=info:pmid/&rft_ieee_id=1487240&rfr_iscdi=true