Ellipsometric studies of natural films on GaAs

Ellipsometric angles Δ and ψ of about 20 samples of GaAs single‐crystals with natural thin films are studied for several angles of incidence at room temperature within several years period at λ = 632.8 nm. Δ and ψ are used to determine the optical constants n and k of GaAs and the thickuess and refr...

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Veröffentlicht in:	Physica status solidi. A, Applied research Applied research, 1988-05, Vol.107 (1), p.239-251
1. Verfasser:	LUKES, F
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Physics
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