Improved LEED system using positio-sensitive detection

Improved LEED system using positio-sensitive detection

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Veröffentlicht in:Review of scientific instruments 1988, Vol.59 (9), p.1951-1953
1. Verfasser: MALIC, R. A
Format: Artikel
Sprache:eng
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Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
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container_end_page 1953
container_issue 9
container_start_page 1951
container_title Review of scientific instruments
container_volume 59
creator MALIC, R. A
description
format Article
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identifier ISSN: 0034-6748
ispartof Review of scientific instruments, 1988, Vol.59 (9), p.1951-1953
issn 0034-6748
1089-7623
language eng
recordid cdi_pascalfrancis_primary_7196023
source AIP Digital Archive
subjects Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
title Improved LEED system using positio-sensitive detection
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