A variable frequency method for wide-band microwave material characterization
A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of erro...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 1990-08, Vol.39 (4), p.609-614 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 614 |
|---|---|
| container_issue | 4 |
| container_start_page | 609 |
| container_title | IEEE transactions on instrumentation and measurement |
| container_volume | 39 |
| creator | Mattar, K.E. Brodwin, M.E. |
| description | A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of errors are outlined, and range and limitations on conductivity are discussed. Results of measurements of Teflon and silicon are presented.< > |
| doi_str_mv | 10.1109/19.57242 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_pascalfrancis_primary_5578443</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>57242</ieee_id><sourcerecordid>28690180</sourcerecordid><originalsourceid>FETCH-LOGICAL-c303t-5fcfee8d1b84ee58869165292b30af75916ed3fb502070a2a1d237d48efc28263</originalsourceid><addsrcrecordid>eNpFkM1LAzEQxYMoWKvg1VsOIl62JtnNJnssxS-oeNHzMpud0Mh-1GTbUv960w_0NDzmN483j5Brziacs-KBFxOpRCZOyIhLqZIiz8UpGTHGdVJkMj8nFyF8McZUnqkReZvSNXgHVYPUevxeYWe2tMVh0dfU9p5uXI1JBV1NW2d8v4E10hYGjDcNNQvwYHbiBwbXd5fkzEIT8Oo4x-Tz6fFj9pLM359fZ9N5YlKWDom0xiLqmlc6Q5Ra5wXPpShElTKwSkaFdWoryQRTDATwWqSqzjRaI7TI0zG5O_gufR8jh6FsXTDYNNBhvwqliI7xYRbB-wMYo4fg0ZZL71rw25KzctdXyYty31dEb4-eEAw01kNnXPjjY5c6y9KI3Rwwh4j_273FL69Nce0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28690180</pqid></control><display><type>article</type><title>A variable frequency method for wide-band microwave material characterization</title><source>IEEE Electronic Library (IEL)</source><creator>Mattar, K.E. ; Brodwin, M.E.</creator><creatorcontrib>Mattar, K.E. ; Brodwin, M.E.</creatorcontrib><description>A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of errors are outlined, and range and limitations on conductivity are discussed. Results of measurements of Teflon and silicon are presented.< ></description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/19.57242</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuits ; Coaxial components ; Dielectric measurements ; Electronics ; Exact sciences and technology ; Frequency ; Materials ; Microwave measurements ; Microwave theory and techniques ; Optical reflection ; Permittivity measurement ; Tuning ; Wideband</subject><ispartof>IEEE transactions on instrumentation and measurement, 1990-08, Vol.39 (4), p.609-614</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c303t-5fcfee8d1b84ee58869165292b30af75916ed3fb502070a2a1d237d48efc28263</citedby><cites>FETCH-LOGICAL-c303t-5fcfee8d1b84ee58869165292b30af75916ed3fb502070a2a1d237d48efc28263</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/57242$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/57242$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5578443$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Mattar, K.E.</creatorcontrib><creatorcontrib>Brodwin, M.E.</creatorcontrib><title>A variable frequency method for wide-band microwave material characterization</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of errors are outlined, and range and limitations on conductivity are discussed. Results of measurements of Teflon and silicon are presented.< ></description><subject>Applied sciences</subject><subject>Circuits</subject><subject>Coaxial components</subject><subject>Dielectric measurements</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Frequency</subject><subject>Materials</subject><subject>Microwave measurements</subject><subject>Microwave theory and techniques</subject><subject>Optical reflection</subject><subject>Permittivity measurement</subject><subject>Tuning</subject><subject>Wideband</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1990</creationdate><recordtype>article</recordtype><recordid>eNpFkM1LAzEQxYMoWKvg1VsOIl62JtnNJnssxS-oeNHzMpud0Mh-1GTbUv960w_0NDzmN483j5Brziacs-KBFxOpRCZOyIhLqZIiz8UpGTHGdVJkMj8nFyF8McZUnqkReZvSNXgHVYPUevxeYWe2tMVh0dfU9p5uXI1JBV1NW2d8v4E10hYGjDcNNQvwYHbiBwbXd5fkzEIT8Oo4x-Tz6fFj9pLM359fZ9N5YlKWDom0xiLqmlc6Q5Ra5wXPpShElTKwSkaFdWoryQRTDATwWqSqzjRaI7TI0zG5O_gufR8jh6FsXTDYNNBhvwqliI7xYRbB-wMYo4fg0ZZL71rw25KzctdXyYty31dEb4-eEAw01kNnXPjjY5c6y9KI3Rwwh4j_273FL69Nce0</recordid><startdate>19900801</startdate><enddate>19900801</enddate><creator>Mattar, K.E.</creator><creator>Brodwin, M.E.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19900801</creationdate><title>A variable frequency method for wide-band microwave material characterization</title><author>Mattar, K.E. ; Brodwin, M.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c303t-5fcfee8d1b84ee58869165292b30af75916ed3fb502070a2a1d237d48efc28263</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1990</creationdate><topic>Applied sciences</topic><topic>Circuits</topic><topic>Coaxial components</topic><topic>Dielectric measurements</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Frequency</topic><topic>Materials</topic><topic>Microwave measurements</topic><topic>Microwave theory and techniques</topic><topic>Optical reflection</topic><topic>Permittivity measurement</topic><topic>Tuning</topic><topic>Wideband</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mattar, K.E.</creatorcontrib><creatorcontrib>Brodwin, M.E.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mattar, K.E.</au><au>Brodwin, M.E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A variable frequency method for wide-band microwave material characterization</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1990-08-01</date><risdate>1990</risdate><volume>39</volume><issue>4</issue><spage>609</spage><epage>614</epage><pages>609-614</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of errors are outlined, and range and limitations on conductivity are discussed. Results of measurements of Teflon and silicon are presented.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/19.57242</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9456 |
| ispartof | IEEE transactions on instrumentation and measurement, 1990-08, Vol.39 (4), p.609-614 |
| issn | 0018-9456 1557-9662 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_5578443 |
| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Circuits Coaxial components Dielectric measurements Electronics Exact sciences and technology Frequency Materials Microwave measurements Microwave theory and techniques Optical reflection Permittivity measurement Tuning Wideband |
| title | A variable frequency method for wide-band microwave material characterization |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T15%3A21%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20variable%20frequency%20method%20for%20wide-band%20microwave%20material%20characterization&rft.jtitle=IEEE%20transactions%20on%20instrumentation%20and%20measurement&rft.au=Mattar,%20K.E.&rft.date=1990-08-01&rft.volume=39&rft.issue=4&rft.spage=609&rft.epage=614&rft.pages=609-614&rft.issn=0018-9456&rft.eissn=1557-9662&rft.coden=IEIMAO&rft_id=info:doi/10.1109/19.57242&rft_dat=%3Cproquest_RIE%3E28690180%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28690180&rft_id=info:pmid/&rft_ieee_id=57242&rfr_iscdi=true |