A variable frequency method for wide-band microwave material characterization

A variable frequency method for wide-band microwave material characterization

A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of erro...

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 1990-08, Vol.39 (4), p.609-614
Hauptverfasser: Mattar, K.E., Brodwin, M.E.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Circuits
Coaxial components
Dielectric measurements
Electronics
Exact sciences and technology
Frequency
Materials
Microwave measurements
Microwave theory and techniques
Optical reflection
Permittivity measurement
Tuning
Wideband
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Zusammenfassung:A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of errors are outlined, and range and limitations on conductivity are discussed. Results of measurements of Teflon and silicon are presented.< >
ISSN:0018-9456
1557-9662
DOI:10.1109/19.57242