Effect of Two Critical Angles of X-Ray Surface Diffraction on Secondary Emission Yield

Effect of Two Critical Angles of X-Ray Surface Diffraction on Secondary Emission Yield

The dependence of secondary fluorescence yield from the crystal on the angle of incidence of an X‐ray beam under conditions of surface diffraction is theoretically studied. It is shown, that location of surface deposited impurity atoms in the crystal matrix may be determined from the shape of second...

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Veröffentlicht in:Physica status solidi. A, Applied research Applied research, 1990-11, Vol.122 (1), p.69-72
Hauptverfasser: Baryshevskii, V. G., Stepanov, S. A.
Format: Artikel
Sprache:eng
Schlagworte:
Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Exact sciences and technology
Impurities: concentration, distribution, and gradients
Physics
Structure of solids and liquids
crystallography
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Zusammenfassung:The dependence of secondary fluorescence yield from the crystal on the angle of incidence of an X‐ray beam under conditions of surface diffraction is theoretically studied. It is shown, that location of surface deposited impurity atoms in the crystal matrix may be determined from the shape of secondary emission curves. [Russian Text Ignored].
ISSN:0031-8965
1521-396X
DOI:10.1002/pssa.2211220105