ac detection of secondary photoelectrons

A current channeltron whose anode is biased at positive high voltage is used in conjunction with a lock‐in amplifier to measure secondary photoelectron emission. The detector has good sensitivity, noise rejection, and produces surface x‐ray absorption fine structure (XAFS) spectra with low noise‐to‐...

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Bibliographische Detailangaben
Veröffentlicht in:	Review of scientific instruments 1991-04, Vol.62 (4), p.1113-1114
Hauptverfasser:	Ruckman, M. W., Qiu, S. L., Strongin, Myron
Format:	Artikel
Sprache:	eng
Schlagworte:	440800 - Miscellaneous Instrumentation- (1990-) DESIGN ELECTRON MULTIPLIERS ELECTRON SPECTROSCOPY ELECTRON TUBES Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy MEASURING INSTRUMENTS MICROCHANNEL ELECTRON MULTIPLIERS OTHER INSTRUMENTATION PHOTOELECTRON SPECTROSCOPY Physics RADIATION DETECTORS SECONDARY EMISSION DETECTORS SENSITIVITY SIGNAL-TO-NOISE RATIO SPECTROMETERS SPECTROSCOPY THIN FILMS X-RAY SPECTROMETERS
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