ac detection of secondary photoelectrons

ac detection of secondary photoelectrons

A current channeltron whose anode is biased at positive high voltage is used in conjunction with a lock‐in amplifier to measure secondary photoelectron emission. The detector has good sensitivity, noise rejection, and produces surface x‐ray absorption fine structure (XAFS) spectra with low noise‐to‐...

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Bibliographische Detailangaben
Veröffentlicht in:Review of scientific instruments 1991-04, Vol.62 (4), p.1113-1114
Hauptverfasser: Ruckman, M. W., Qiu, S. L., Strongin, Myron
Format: Artikel
Sprache:eng
Schlagworte:
440800 - Miscellaneous Instrumentation- (1990-)
DESIGN
ELECTRON MULTIPLIERS
ELECTRON SPECTROSCOPY
ELECTRON TUBES
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
MEASURING INSTRUMENTS
MICROCHANNEL ELECTRON MULTIPLIERS
OTHER INSTRUMENTATION
PHOTOELECTRON SPECTROSCOPY
Physics
RADIATION DETECTORS
SECONDARY EMISSION DETECTORS
SENSITIVITY
SIGNAL-TO-NOISE RATIO
SPECTROMETERS
SPECTROSCOPY
THIN FILMS
X-RAY SPECTROMETERS
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Beschreibung
Zusammenfassung:A current channeltron whose anode is biased at positive high voltage is used in conjunction with a lock‐in amplifier to measure secondary photoelectron emission. The detector has good sensitivity, noise rejection, and produces surface x‐ray absorption fine structure (XAFS) spectra with low noise‐to‐signal ratios. The need to modulate the photoelectron emission current can be exploited to limit the detection of photoelectrons to the sample.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1142021