FOURIER ANALYSIS OF X-RAY PATTERNS OF VITREOUS SiO2 AND B2O3

ABSTRACT The X‐ray scattering curves for vitreous SiO2 and B2O3 are obtained in a vacuum camera, using monochromatic Mo and Cu radiation. A Fourier analysis of the scattering curve gives directly a curve representing the distribution of neighboring atoms about any one atom. For SiO2, the distribution curve establishes difinitely the tetrahedral silicon‐oxygen network. The distribution curve for B2O3 indicates a triangular coördination, each boron surrounded by three oxygens, and each oxygen shared between two borons. The interatomic distances which are found are in good agreement with the values found in crystalline silicates and borates. The importance of the new Fourier method of analysis of glass diffraction patterns is emphasized by the fact that the distribution curves which are obtained are unique, no assumptions as to structure being involved.