Investigation of thin oxide 57Fe films by Mössbauer total external reflection

Depth selectivity of Mössbauer total external reflection (TER) is demonstrated. A series of CEMS spectra at different glancing angles of an evaporated 20 nm 57Fe film on glass substrate are obtained. A theory of propagation of the radiation in the multilayer medium under TER conditions is used for the interpretation of the results taking into account multiple reflections in each layer. The computer fit gives the three step depth profiles of the distribution of different hyperfine interactions in the film. [Russian Text Ignored].