Curve fitting and error modeling for the digitization process near the Nyquist rate
Model-based parametric estimation (MBPE) techniques are used to numerically examine the limits of waveform digitization errors. MBPE has proven very successful for the effective bits test of digitizer accuracy, and it is shown that it is a strong candidate for reconstruction whenever some a priori i...
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Veröffentlicht in: | IEEE transactions on instrumentation and measurement 1991-06, Vol.40 (3), p.553-557 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Model-based parametric estimation (MBPE) techniques are used to numerically examine the limits of waveform digitization errors. MBPE has proven very successful for the effective bits test of digitizer accuracy, and it is shown that it is a strong candidate for reconstruction whenever some a priori information is available. The numerical results aid in the optimum use of modern transient recorders to their full analog bandwidth capability. The model may be used either as a tool in understanding absolute performance capability for the highly nonlinear space near the Nyquist limit or as a practical experimental aid when setting specifications for a real measurement.< > |
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ISSN: | 0018-9456 1557-9662 |
DOI: | 10.1109/19.87018 |