Optically guided large‐nanostructure probe

A large‐nanostructure probe with optically guided macroscopic scanning has been developed for high‐resolution imaging and characterization of nanostructures. The novel optical viewing system allows placement of the imaging tip to within 1 μm of a desired site on the sample during coarse positioning....

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Veröffentlicht in:	Review of scientific instruments 1993-05, Vol.64 (5), p.1248-1252
Hauptverfasser:	Marchman, Herschel M., Wetsel, Grover C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	A large‐nanostructure probe with optically guided macroscopic scanning has been developed for high‐resolution imaging and characterization of nanostructures. The novel optical viewing system allows placement of the imaging tip to within 1 μm of a desired site on the sample during coarse positioning. Fine positioning and imaging are accomplished with nanometer‐scale resolution using a segmented‐tube piezoelectric scanner. High‐resolution images of identifiable quantum dots have been obtained to demonstrate the efficacy of the method.
ISSN:	0034-6748 1089-7623
DOI:	10.1063/1.1144125