The influence of the native BaAl2O4 boundary layer on microstructure and properties of YBa2Cu3O7-x thin films grown on sapphire

The influence of the native BaAl2O4 boundary layer on microstructure and properties of YBa2Cu3O7-x thin films grown on sapphire

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Materials science & engineering. B, Solid-state materials for advanced technology Solid-state materials for advanced technology, 1992-10, Vol.15 (1), p.25-31
Hauptverfasser: DOVINDENKO, K, OKTYABRSKY, S, TOKARCHUK, D, MICHALTSOV, A, IVANOV, A
Format: Artikel
Sprache:eng
Schlagworte:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Physics
Superconducting films and low-dimensional structures
Superconductivity
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 31
container_issue 1
container_start_page 25
container_title Materials science & engineering. B, Solid-state materials for advanced technology
container_volume 15
creator DOVINDENKO, K
OKTYABRSKY, S
TOKARCHUK, D
MICHALTSOV, A
IVANOV, A
description
doi_str_mv 10.1016/0921-5107(92)90024-4
format Article
fullrecord <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_4599556</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>4599556</sourcerecordid><originalsourceid>FETCH-LOGICAL-p182t-c52040196ac3d16aed5c1df171ddc704e9c90740b9a9cf34a8cc1aebdf2f7c2a3</originalsourceid><addsrcrecordid>eNo9z0tLAzEUBeAgCtbqP3CRhQtdRHMzmUmzbIsvKHRTF67KbR42MpMZkhm1K_-6LYqrA4fDB4eQS-C3wKG641oAK4Gray1uNOdCMnlERjBRBZNaymMy-p-ckrOc3znnIIQYke_V1tEQfT24aBxtPe33RcQ-fDg6w2ktlpJu2iFaTDta484l2kbaBJPa3KfB9ENyFKOlXWo7l_rg8kF5naGYD8VSsa-9GCL1oW4yfUvtZzwAGbtuG5I7Jyce6-wu_nJMXh7uV_Mntlg-Ps-nC9bBRPTMlIJLDrpCU1io0NnSgPWgwFqjuHTaaK4k32jUxhcSJ8YAuo31wisjsBiTq1-3w2yw9gmjCXndpdDsj61lqXVZVsUP6xtjvw</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>The influence of the native BaAl2O4 boundary layer on microstructure and properties of YBa2Cu3O7-x thin films grown on sapphire</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>DOVINDENKO, K ; OKTYABRSKY, S ; TOKARCHUK, D ; MICHALTSOV, A ; IVANOV, A</creator><creatorcontrib>DOVINDENKO, K ; OKTYABRSKY, S ; TOKARCHUK, D ; MICHALTSOV, A ; IVANOV, A</creatorcontrib><identifier>ISSN: 0921-5107</identifier><identifier>EISSN: 1873-4944</identifier><identifier>DOI: 10.1016/0921-5107(92)90024-4</identifier><language>eng</language><publisher>Amsterdam: Elsevier</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Physics ; Superconducting films and low-dimensional structures ; Superconductivity</subject><ispartof>Materials science &amp; engineering. B, Solid-state materials for advanced technology, 1992-10, Vol.15 (1), p.25-31</ispartof><rights>1993 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=4599556$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>DOVINDENKO, K</creatorcontrib><creatorcontrib>OKTYABRSKY, S</creatorcontrib><creatorcontrib>TOKARCHUK, D</creatorcontrib><creatorcontrib>MICHALTSOV, A</creatorcontrib><creatorcontrib>IVANOV, A</creatorcontrib><title>The influence of the native BaAl2O4 boundary layer on microstructure and properties of YBa2Cu3O7-x thin films grown on sapphire</title><title>Materials science &amp; engineering. B, Solid-state materials for advanced technology</title><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Superconducting films and low-dimensional structures</subject><subject>Superconductivity</subject><issn>0921-5107</issn><issn>1873-4944</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNo9z0tLAzEUBeAgCtbqP3CRhQtdRHMzmUmzbIsvKHRTF67KbR42MpMZkhm1K_-6LYqrA4fDB4eQS-C3wKG641oAK4Gray1uNOdCMnlERjBRBZNaymMy-p-ckrOc3znnIIQYke_V1tEQfT24aBxtPe33RcQ-fDg6w2ktlpJu2iFaTDta484l2kbaBJPa3KfB9ENyFKOlXWo7l_rg8kF5naGYD8VSsa-9GCL1oW4yfUvtZzwAGbtuG5I7Jyce6-wu_nJMXh7uV_Mntlg-Ps-nC9bBRPTMlIJLDrpCU1io0NnSgPWgwFqjuHTaaK4k32jUxhcSJ8YAuo31wisjsBiTq1-3w2yw9gmjCXndpdDsj61lqXVZVsUP6xtjvw</recordid><startdate>19921015</startdate><enddate>19921015</enddate><creator>DOVINDENKO, K</creator><creator>OKTYABRSKY, S</creator><creator>TOKARCHUK, D</creator><creator>MICHALTSOV, A</creator><creator>IVANOV, A</creator><general>Elsevier</general><scope>IQODW</scope></search><sort><creationdate>19921015</creationdate><title>The influence of the native BaAl2O4 boundary layer on microstructure and properties of YBa2Cu3O7-x thin films grown on sapphire</title><author>DOVINDENKO, K ; OKTYABRSKY, S ; TOKARCHUK, D ; MICHALTSOV, A ; IVANOV, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p182t-c52040196ac3d16aed5c1df171ddc704e9c90740b9a9cf34a8cc1aebdf2f7c2a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Superconducting films and low-dimensional structures</topic><topic>Superconductivity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>DOVINDENKO, K</creatorcontrib><creatorcontrib>OKTYABRSKY, S</creatorcontrib><creatorcontrib>TOKARCHUK, D</creatorcontrib><creatorcontrib>MICHALTSOV, A</creatorcontrib><creatorcontrib>IVANOV, A</creatorcontrib><collection>Pascal-Francis</collection><jtitle>Materials science &amp; engineering. B, Solid-state materials for advanced technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>DOVINDENKO, K</au><au>OKTYABRSKY, S</au><au>TOKARCHUK, D</au><au>MICHALTSOV, A</au><au>IVANOV, A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The influence of the native BaAl2O4 boundary layer on microstructure and properties of YBa2Cu3O7-x thin films grown on sapphire</atitle><jtitle>Materials science &amp; engineering. B, Solid-state materials for advanced technology</jtitle><date>1992-10-15</date><risdate>1992</risdate><volume>15</volume><issue>1</issue><spage>25</spage><epage>31</epage><pages>25-31</pages><issn>0921-5107</issn><eissn>1873-4944</eissn><cop>Amsterdam</cop><pub>Elsevier</pub><doi>10.1016/0921-5107(92)90024-4</doi><tpages>7</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0921-5107
ispartof Materials science & engineering. B, Solid-state materials for advanced technology, 1992-10, Vol.15 (1), p.25-31
issn 0921-5107
1873-4944
language eng
recordid cdi_pascalfrancis_primary_4599556
source ScienceDirect Journals (5 years ago - present)
subjects Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Physics
Superconducting films and low-dimensional structures
Superconductivity
title The influence of the native BaAl2O4 boundary layer on microstructure and properties of YBa2Cu3O7-x thin films grown on sapphire
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T09%3A11%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20influence%20of%20the%20native%20BaAl2O4%20boundary%20layer%20on%20microstructure%20and%20properties%20of%20YBa2Cu3O7-x%20thin%20films%20grown%20on%20sapphire&rft.jtitle=Materials%20science%20&%20engineering.%20B,%20Solid-state%20materials%20for%20advanced%20technology&rft.au=DOVINDENKO,%20K&rft.date=1992-10-15&rft.volume=15&rft.issue=1&rft.spage=25&rft.epage=31&rft.pages=25-31&rft.issn=0921-5107&rft.eissn=1873-4944&rft_id=info:doi/10.1016/0921-5107(92)90024-4&rft_dat=%3Cpascalfrancis%3E4599556%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true