A direct comparison of Ge and Si(Li) detectors in the 2-20 keV range

The spectral response of high-purity Ge (HPGe) and lithium-drifted Si (Si(Li)) surface barrier detectors of similar geometry has been measured over a range of X-ray energies under identical experimental conditions. Detector characteristics such as spectral background, escape peak intensity, entrance...

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Veröffentlicht in:IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1992-08, Vol.39 (4), p.570-576
Hauptverfasser: Rossington, C.S., Giauque, R.D., Jaklevic, J.M.
Format: Artikel
Sprache:eng
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Zusammenfassung:The spectral response of high-purity Ge (HPGe) and lithium-drifted Si (Si(Li)) surface barrier detectors of similar geometry has been measured over a range of X-ray energies under identical experimental conditions. Detector characteristics such as spectral background, escape peak intensity, entrance window absorption, and energy resolution are presented and compared. Although these characteristics have been discussed previously, the authors attempt to consolidate the information by making comparisons under equivalent experimental conditions for the two types of detectors. A primary goal of the study was a comparison of the two types of detectors for use in X-ray fluorescence applications.< >
ISSN:0018-9499
1558-1578
DOI:10.1109/23.159667