An extension to the dynamic plane source technique for measuring thermal conductivity, thermal diffusivity, and specific heat of dielectric solids
The recently developed dynamic plane source (DPS) technique for simultaneous determination of the thermal properties of fast thermally conducting materials with thermal conductivities between 200 and 2 W/mK has now been extended for studying relatively slow conducting materials with thermal conducti...
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Veröffentlicht in: | Review of scientific instruments 1992-10, Vol.63 (10), p.4390-4397 |
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