An extension to the dynamic plane source technique for measuring thermal conductivity, thermal diffusivity, and specific heat of dielectric solids

The recently developed dynamic plane source (DPS) technique for simultaneous determination of the thermal properties of fast thermally conducting materials with thermal conductivities between 200 and 2 W/mK has now been extended for studying relatively slow conducting materials with thermal conductivities equal or below 2 W/mK. The method is self‐checking since the thermal conductivity, thermal diffusivity specific heat, and effusivity of the material are obtained independently from each other. The theory of the technique and the experimental arrangement are given in detail. The data evaluation procedure is simple and makes it possible to reveal the distortions due to the nonideal experimental conditions. The extension to the DPS technique has been implemented at room temperature to study the samples of cordierite‐based ceramic Cecorite 130P (thermal conductivity equal to 1.48 W/mK), rubber (0.403 W/mK), and polycarbonate (0.245 W/mK). The accuracy of the method is within ±5%.