Influence of low-frequency 1/f noise on threshold characteristics of photodetectors with charge accumulation
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| Veröffentlicht in: | Infrared physics 1992-11, Vol.33 (6), p.451-457 |
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| Hauptverfasser: | , , |
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| Sprache: | eng |
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| container_end_page | 457 |
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| container_issue | 6 |
| container_start_page | 451 |
| container_title | Infrared physics |
| container_volume | 33 |
| creator | SUKHANOV, A. N OSIPOV, V. V MAMEDOV, I. M |
| description | |
| doi_str_mv | 10.1016/0020-0891(92)90059-3 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0020-0891 |
| ispartof | Infrared physics, 1992-11, Vol.33 (6), p.451-457 |
| issn | 0020-0891 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_4413388 |
| source | Alma/SFX Local Collection |
| subjects | Bolometer infrared, submillimeter wave, microwave and radiowave receivers and detectors Exact sciences and technology Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics |
| title | Influence of low-frequency 1/f noise on threshold characteristics of photodetectors with charge accumulation |
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