Auger imaging from rough, chemically inhomogeneous, materials

Bibliographische Detailangaben

Hauptverfasser:	CRONE, M, BARKSHIRE, I. R, PRUTTON, M, KENNY, P. G
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Electron, positron and ion microscopes, electron diffractometers and related techniques Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Scanning probe microscopes, components, and techniques
Online-Zugang:	Volltext
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