Visualization of electrical inhomogeneities in high-ohmic semiconductor plates by an ionization-type photographic system

A device for rapid visualization of electrical and spatial inhomogeneities of GaAs is described. This visualizer is a modification of the ionization type photographic system in which a semiconducting plate is placed between transparent plane parallel electrodes in a gas discharge cell. When a voltag...

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Veröffentlicht in:Journal of physics. D, Applied physics Applied physics, 1994-06, Vol.27 (6), p.1229-1232
Hauptverfasser: Lebedeva, N N, Salamov, B G, Akinoglu, B G, Allakhverdiev, K R
Format: Artikel
Sprache:eng
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Zusammenfassung:A device for rapid visualization of electrical and spatial inhomogeneities of GaAs is described. This visualizer is a modification of the ionization type photographic system in which a semiconducting plate is placed between transparent plane parallel electrodes in a gas discharge cell. When a voltage is applied to the electrodes, a discharge luminescence glows in the gap under uniform infrared illumination of the semiconductor. The observed patterns give information about EL2 centres in the GaAs. (Original abstract-amended)
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/27/6/021