Visualization of electrical inhomogeneities in high-ohmic semiconductor plates by an ionization-type photographic system
A device for rapid visualization of electrical and spatial inhomogeneities of GaAs is described. This visualizer is a modification of the ionization type photographic system in which a semiconducting plate is placed between transparent plane parallel electrodes in a gas discharge cell. When a voltag...
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Veröffentlicht in: | Journal of physics. D, Applied physics Applied physics, 1994-06, Vol.27 (6), p.1229-1232 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | A device for rapid visualization of electrical and spatial inhomogeneities of GaAs is described. This visualizer is a modification of the ionization type photographic system in which a semiconducting plate is placed between transparent plane parallel electrodes in a gas discharge cell. When a voltage is applied to the electrodes, a discharge luminescence glows in the gap under uniform infrared illumination of the semiconductor. The observed patterns give information about EL2 centres in the GaAs. (Original abstract-amended) |
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ISSN: | 0022-3727 1361-6463 |
DOI: | 10.1088/0022-3727/27/6/021 |