EDIM93: a program for electron diffraction intensity measurement from photographic data

A program, EDIM93, for electron diffraction intensity measurement has been developed. The program processes the data from digitized electron diffraction films. The profile decomposition and summation methods are introduced for measuring the blackenings of diffraction spots. They are suitable for different distributions of the spots on the film. The program is applicable to periodic structures and to (3+1)‐ or (3+2)‐dimensional incommensurately modulated structures.