Characterization of compositionally graded Si1-xGex alloy layers by photoluminescence spectroscopy and by cathodoluminescence spectroscopy and imaging

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Journal of applied physics 1993-02, Vol.73 (4), p.1952-1956
Hauptverfasser:	HIGGS, V, LIGHTOWLERS, E. C, FITZGERALD, E. A, XIE, Y. H, SILVERMAN, P. J
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.) Electron states Exact sciences and technology Excitons and related phenomena Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Other solid inorganic materials Photoluminescence Physics Structure of solids and liquids crystallography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!