$X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates$

X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of physics. Condensed matter 1993-11, Vol.5 (44), p.8149-8158
Hauptverfasser:	Findeisen, E, Brugemann, L, Stettner, J, Tolan, M
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Metals. Metallurgy Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Other interactions of matter with particles and radiation Physics Structure of solids and liquids crystallography X-ray absorption spectroscopy: exafs, nexafs, xanes, etc X-ray diffraction and scattering X-ray scattering
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