Scanning electron microscope observation of ridge structures formed on (100) and (110) Gd3Ga5O12 substrates

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Bibliographische Detailangaben
Veröffentlicht in:	Japanese journal of applied physics 1993-07, Vol.32 (7A), p.L911-L913
Hauptverfasser:	KATOH, Y, SUGIMOTO, N, TATE, A
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Circuit properties Condensed matter: structure, mechanical and thermal properties Electric, optical and optoelectronic circuits Electron, ion, and scanning probe microscopy Electronics Exact sciences and technology Optical and optoelectronic circuits Physics Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Transmission, reflection and scanning electron microscopy(including ebic)
Online-Zugang:	Volltext
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