Spectroscopic ellipsometry studies on optical constants of Ge2Sb2Te5 used for phase change optical disks

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Veröffentlicht in:	Japanese journal of applied physics 1995, Vol.34 (4B), p.L529-L532
Hauptverfasser:	IDE, T, SUZUKI, M, OKADA, M
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Fundamental areas of phenomenology (including applications) Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical elements, devices, and systems Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Optical properties of specific thin films Optical properties of specific thin films, surfaces, and low-dimensional structures Optics Physics
Online-Zugang:	Volltext
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