Scanning probe microscopy study of the incommensurate modulation and surface defects in the layered telluride TaGe0.355Te2

The detection of atomic‐size defects by atomic force microscopy (AFM) is demonstrated. For example, the dark grooves in the image of the surface of the incommensurate layered telluride phase TaGe0.355Te2 (see Figure) indicate a defect. The origin of this incommensurate structure of layered telluride...

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Veröffentlicht in:	Advanced materials (Weinheim) 1994-09, Vol.6 (9), p.649-654
Hauptverfasser:	Bengel, Hardy, Cantow, Hans-Joachim, Magonov, Sergei N., Monconduit, Laure, Evain, Michel, Liang, Weigen, Whangho, Myung-Hwan
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Electron, ion, and scanning probe microscopy Exact sciences and technology Halides, chalcogenides and analogous compounds of group vb Inorganic compounds Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Structure of solids and liquids crystallography Structure of specific crystalline solids
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Beschreibung
Zusammenfassung:	The detection of atomic‐size defects by atomic force microscopy (AFM) is demonstrated. For example, the dark grooves in the image of the surface of the incommensurate layered telluride phase TaGe0.355Te2 (see Figure) indicate a defect. The origin of this incommensurate structure of layered tellurides is established and it is shown that high applied forces enhance the image contrast in AFM.
ISSN:	0935-9648 1521-4095
DOI:	10.1002/adma.19940060905