In-situ reflectivity measurements during pulsed-laser deposition of Bi2Sr2CaCu2O8+δ

Reflectivity measurements have been used to monitor the temporal evolution of the surface morphology during in-situ growth of Bi2Sr2CaCu2O8+δ films on (100)MgO by pulsed-laser deposition (PLD). Two regimes with different surface roughnesses can be distinguished. During deposition of the first few la...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Applied surface science 1996-04, Vol.96-98, p.721-725
Hauptverfasser:	Ritzer, Alfons, Falkner, B., Li, S.T., Ba¨uerle, D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bi-based cuprates Bi2Sr2CaCu2O8+δ Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Cuprates superconductors (high tc and insulating parent compounds) Exact sciences and technology High temperature superconductivity High-Tc compounds High-tc films Laser deposition Materials science Methods of deposition of films and coatings film growth and epitaxy Physics Pulsed-laser deposition Reflectivity Superconducting films and low-dimensional structures Superconductivity Thin films
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Reflectivity measurements have been used to monitor the temporal evolution of the surface morphology during in-situ growth of Bi2Sr2CaCu2O8+δ films on (100)MgO by pulsed-laser deposition (PLD). Two regimes with different surface roughnesses can be distinguished. During deposition of the first few lattice constants reflectivity is shown to be sensitive to changes in deposition temperature near the decomposition limit.
ISSN:	0169-4332 1873-5584
DOI:	10.1016/0169-4332(95)00574-9