X-ray scattering from surfaces and interfaces and its application to the characterization of CaF2/Si(111) interfaces

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of crystal growth 1996-05, Vol.163 (1-2), p.31-38
Hauptverfasser:	HARADA, J, TAKAHASHI, I, ITOH, Y, SOKOLOV, N. S, YAKOVLEV, N. L, SHUSTERMAN, Y, ALVAREZ, J. C
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Interface structure and roughness Physics Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) X-ray diffraction and scattering X-ray scattering (including small-angle scattering)
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