X-ray scattering on stacking faults in 123 crystals condidering local changes of distances between atomic layers

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Veröffentlicht in:	Journal of applied crystallography 1996, Vol.29, p.159-163
Hauptverfasser:	RUD, N. D, USTINOV, A. I
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.) Exact sciences and technology Physics Stacking faults and other planar or extended defects Structure of solids and liquids crystallography X-ray diffraction and scattering X-ray scattering (including small-angle scattering)
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ISSN:	0021-8898 1600-5767