Double-crystal diffractometric and topographic studies of (111) oriented synthetic diamonds

Synchrotron x-radiation in a double crystal geometry has been used for topography and rocking curve measurements to study imperfections in single crystal synthetic diamonds grown from (111) seeds by the reconstitution technique. The influence that clusters of small (1-5 \#m\m) opaque particles (sometimes called 'pin-point-like inclusions') have upon lattice parameter differences, as well as upon relative lattice tilts within each sample, was of particular interest. (Abstract uses original text)