A structural and optical study of sputtered InP films as a function of preparation temperature

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Veröffentlicht in:	Journal of physics. Condensed matter 1996-03, Vol.8 (10), p.1591-1605
Hauptverfasser:	Baker, S H, Bayliss, S C, Gurman, S J, Elgun, N, Davis, E A
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Iii-v and ii-vi semiconductors Infrared and raman spectra and scattering Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Physics Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology
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