Impact of microstructure on stability of permanent magnet biased magnetoresistive heads

This work pertains to output voltage stability of soft adjacent layer biased magnetoresistive heads with abutted permanent magnetic films for domain stabilization. A micromagnetic model has been developed to study the effect of the permanent magnet film microstructure and the micromagnetic propertie...

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Veröffentlicht in:	IEEE transactions on magnetics 1996-01, Vol.32 (1), p.54-60
Hauptverfasser:	Zhu, Jian-Gang, O' Connor, D J
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Couplings Electronics Exact sciences and technology Magnetic devices Magnetic films Magnetic heads Magnetic properties Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.) domain-motion devices, etc Magnetoresistance Micromagnetics Microstructure Permanent magnets Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Stability Voltage
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Beschreibung
Zusammenfassung:	This work pertains to output voltage stability of soft adjacent layer biased magnetoresistive heads with abutted permanent magnetic films for domain stabilization. A micromagnetic model has been developed to study the effect of the permanent magnet film microstructure and the micromagnetic properties of the abutted junction interface on head stability. The impact on head stability is analyzed with respect to interfacial ferromagnetic coupling across the junction interface and intergranular exchange coupling in the permanent magnet films among other film properties.
ISSN:	0018-9464 1941-0069
DOI:	10.1109/20.477550