A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits : RELIABILITY AND VARIABILITY OF DEVICES FOR CIRCUITS AND SYSTEMS

Bibliographische Detailangaben

Veröffentlicht in:	Microelectronics and reliability 2014, Vol.54 (6-7), p.1083-1089
Hauptverfasser:	KLEEBERGER, Veit B, BARKE, Martin, WERNER, Christoph, SCHMITT-LANDSIEDEL, Doris, SCHLICHTMANN, Ulf
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online-Zugang:	Volltext
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