Semianalytical Model of the Subthreshold Current in Short-Channel Junctionless Symmetric Double-Gate Field-Effect Transistors

A 2-D semianalytical solution for the electrostatic potential valid for junctionless symmetric double-gate field-effect transistors in subthreshold regime is proposed, which is based on the parabolic approximation for the potential and removes previous limitations. Based on such a solution, a semi-a...

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Veröffentlicht in:IEEE transactions on electron devices 2013-04, Vol.60 (4), p.1342-1348
Hauptverfasser: Gnudi, A., Reggiani, S., Gnani, E., Baccarani, G.
Format: Artikel
Sprache:eng
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Zusammenfassung:A 2-D semianalytical solution for the electrostatic potential valid for junctionless symmetric double-gate field-effect transistors in subthreshold regime is proposed, which is based on the parabolic approximation for the potential and removes previous limitations. Based on such a solution, a semi-analytical expression for the current is derived. The potential and current models are validated through comparisons with TCAD simulations and are used to evaluate relevant short-channel effect parameters, such as threshold roll-off, drain-induced barrier lowering, and inverse subthreshold slope. The implications of different possible definitions of threshold voltage, either based on the potential in the channel or on a fixed current level, are discussed. Finally, a fully analytical simplification for the current is suggested, which can be used in compact models for circuit simulations.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2013.2247765