Phase transition in sputtered Hf02 thin films: A qualitative Raman study

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Veröffentlicht in:	Applied surface science 2012, Vol.261, p.727-729
Hauptverfasser:	BELO, G. S, NAKAGOMI, F, MINKO, A, DA SILVA, S. W, MORAIS, P. C, BUCHANAN, D. A
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Deposition by sputtering Exact sciences and technology Infrared and Raman spectra Infrared and raman spectra and scattering Materials science Methods of deposition of films and coatings film growth and epitaxy Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Phase transitions and critical phenomena Physics Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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ISSN:	0169-4332 1873-5584