Physical Simulation of Silicon-Nanocrystal-Based Single-Electron Transistors
A 3-D simulator of semiconducting nanocrystal (NC)-based single-electron transistors (SETs) is presented. It is based on the self-consistent solution of Poisson and Schrödinger equations. The resulting wave functions are used to compute the bias-dependent tunneling rates in the weak dot-to-lead cou...
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Veröffentlicht in: | IEEE transactions on electron devices 2011-10, Vol.58 (10), p.3286-3293 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A 3-D simulator of semiconducting nanocrystal (NC)-based single-electron transistors (SETs) is presented. It is based on the self-consistent solution of Poisson and Schrödinger equations. The resulting wave functions are used to compute the bias-dependent tunneling rates in the weak dot-to-lead coupling limit. These rates are used as input data of a Monte Carlo code, which treats the sequential transport of electrons through the tunnel barriers. The simulator is applied to a typical silicon-NC SET. The resulting current-voltage characteristics are discussed in terms of tunneling rates, chemical potentials, and wave functions. The influence of all device parameters and of the temperature are carefully analyzed. |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/TED.2011.2161611 |