Physical Simulation of Silicon-Nanocrystal-Based Single-Electron Transistors

A 3-D simulator of semiconducting nanocrystal (NC)-based single-electron transistors (SETs) is presented. It is based on the self-consistent solution of Poisson and Schrödinger equations. The resulting wave functions are used to compute the bias-dependent tunneling rates in the weak dot-to-lead cou...

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Veröffentlicht in:IEEE transactions on electron devices 2011-10, Vol.58 (10), p.3286-3293
Hauptverfasser: Talbo, V., Galdin-Retailleau, S., Valentin, A., Dollfus, P.
Format: Artikel
Sprache:eng
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Zusammenfassung:A 3-D simulator of semiconducting nanocrystal (NC)-based single-electron transistors (SETs) is presented. It is based on the self-consistent solution of Poisson and Schrödinger equations. The resulting wave functions are used to compute the bias-dependent tunneling rates in the weak dot-to-lead coupling limit. These rates are used as input data of a Monte Carlo code, which treats the sequential transport of electrons through the tunnel barriers. The simulator is applied to a typical silicon-NC SET. The resulting current-voltage characteristics are discussed in terms of tunneling rates, chemical potentials, and wave functions. The influence of all device parameters and of the temperature are carefully analyzed.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2011.2161611