Short Term Cell-Flipping Technique for Mitigating SNM Degradation Due to NBTI : Circuits and Desig Techniques for Advanced Large Scale Integration

Bibliographische Detailangaben

Veröffentlicht in:	IEICE transactions on electronics 2011, Vol.94 (4), p.520-529
Hauptverfasser:	KUNITAKE, Yuji, SATO, Toshinori, YASUURA, Hiroto
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Integrated circuits by function (including memories and processors) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transistors
Online-Zugang:	Volltext
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