A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits : Circuits and Desig Techniques for Advanced Large Scale Integration

Bibliographische Detailangaben

Veröffentlicht in:	IEICE transactions on electronics 2011, Vol.94 (4), p.495-503
Hauptverfasser:	BANDO, Yoji, TAKAYA, Satoshi, OHKAWA, Toru, TAKARAMOTO, Toshiharu, YAMADA, Toshio, SOUDA, Masaaki, KUMASHIRO, Shigetaka, MOGAMI, Tohru, NAGATA, Makoto
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electrical engineering. Electrical power engineering Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Integrated circuits Power electronics, power supplies Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!