Characterization of crosstalk noise in submicron CMOS integrated circuits: an experimental view

A way to characterize the crosstalk noise susceptibility for integrated circuits fabrication technologies is presented. A comparison between 0.7- and 0.35-/spl mu/m technologies shows the increasing importance of crosstalk noise and, therefore, the need to consider this effect at the design level in...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE transactions on electromagnetic compatibility 1998-08, Vol.40 (3), p.271-280
Hauptverfasser:	Fourniols, J.-Y., Roca, M., Caignet, F., Sicard, E.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences CMOS integrated circuits CMOS technology Coupling circuits Crosstalk Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuit interconnections Integrated circuit measurements Integrated circuit noise Integrated circuit technology Integrated circuits Noise measurement Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Sensor phenomena and characterization Testing, measurement, noise and reliability
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!