High-efficiency cell-substrate displacement acquisition via digital image correlation method using basis functions: MICRO AND NANO METROLOGY IN EXPERIMENTAL MECHANICS

Bibliographische Detailangaben

Veröffentlicht in:	Optics and lasers in engineering 2010, Vol.48 (11), p.1058-1066
Hauptverfasser:	JIANYONG HUANG, XIAOCHANG PAN, XIAOLING PENG, TAO ZHU, LEI QIN, CHUNYANG XIONG, JING FANG
Format:	Artikel
Sprache:	eng
Schlagworte:	Exact sciences and technology Fundamental areas of phenomenology (including applications) Image forming and processing Imaging and optical processing Instruments, apparatus, components and techniques common to several branches of physics and astronomy Optical instruments, equipment and techniques Optics Physics
Online-Zugang:	Volltext
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